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Linked Open Data
1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance
Identificadores del recurso
http://oa.upm.es/2038/
Procedencia
(Archivo Digital UPM)

Ficha

Título:
1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance
Tema:
Electrónica
Descripción:
Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge's formula but also allows the design of proper shields to reduce 1/f noise.
Fuente:
IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 2008-03, Vol. 57, No. 3
Idioma:
English
Relación:
http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf
http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4447379&arnumber=4413160&count=26&index=6
info:eu-repo/semantics/altIdentifier/doi/10.1109/TIM.2007.911642
Autor/Productor:
Izpura Torres, José Ignacio
Editor:
E.T.S.I. Telecomunicación (UPM)
Derechos:
http://creativecommons.org/licenses/by-nc-nd/3.0/es/
info:eu-repo/semantics/openAccess
Fecha:
2008-03
Tipo de recurso:
info:eu-repo/semantics/article
Artículo
PeerReviewed
Formato:
application/pdf

oai_dc

Descargar XML

    <?xml version="1.0" encoding="UTF-8" ?>

  1. <oai_dc:dc schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">

    1. <dc:title>1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance</dc:title>

    2. <dc:creator>Izpura Torres, José Ignacio</dc:creator>

    3. <dc:subject>Electrónica</dc:subject>

    4. <dc:description>Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge's formula but also allows the design of proper shields to reduce 1/f noise.</dc:description>

    5. <dc:publisher>E.T.S.I. Telecomunicación (UPM)</dc:publisher>

    6. <dc:rights>http://creativecommons.org/licenses/by-nc-nd/3.0/es/</dc:rights>

    7. <dc:date>2008-03</dc:date>

    8. <dc:type>info:eu-repo/semantics/article</dc:type>

    9. <dc:type>Artículo</dc:type>

    10. <dc:source>IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 2008-03, Vol. 57, No. 3</dc:source>

    11. <dc:type>PeerReviewed</dc:type>

    12. <dc:format>application/pdf</dc:format>

    13. <dc:language>eng</dc:language>

    14. <dc:relation>http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf</dc:relation>

    15. <dc:relation>http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4447379&arnumber=4413160&count=26&index=6</dc:relation>

    16. <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>

    17. <dc:relation>info:eu-repo/semantics/altIdentifier/doi/10.1109/TIM.2007.911642</dc:relation>

    18. <dc:identifier>http://oa.upm.es/2038/</dc:identifier>

    </oai_dc:dc>

didl

Descargar XML

    <?xml version="1.0" encoding="UTF-8" ?>

  1. <didl:DIDL DIDLDocumentId="http://oa.upm.es/id/eprint/2038" schemaLocation="urn:mpeg:mpeg21:2002:02-DIDL-NS http://standards.iso.org/ittf/PubliclyAvailableStandards/MPEG-21_schema_files/did/didl.xsd urn:mpeg:mpeg21:2002:01-DII-NS http://standards.iso.org/ittf/PubliclyAvailableStandards/MPEG-21_schema_files/dii/dii.xsd urn:mpeg:mpeg21:2005:01-DIP-NS http://standards.iso.org/ittf/PubliclyAvailableStandards/MPEG-21_schema_files/dip/dip.xsd">

    1. <didl:Item>

      1. <didl:Descriptor>

        1. <didl:Statement mimeType="application/xml">

          1. <dii:Identifier>http://oa.upm.es/id/eprint/2038</dii:Identifier>

          </didl:Statement>

        </didl:Descriptor>

      2. <didl:Descriptor>

        1. <didl:Statement mimeType="application/xml">

          1. <dcterms:modified>2016-04-20T11:50:22Z</dcterms:modified>

          </didl:Statement>

        </didl:Descriptor>

      3. <didl:Component>

        1. <didl:Resource mimeType="application/xml" ref="http://oa.upm.es/cgi/export/eprint/2038/DIDL/upm-eprint-2038.xml" />

        </didl:Component>

      4. <didl:Item>

        1. <didl:Descriptor>

          1. <didl:Statement mimeType="application/xml">

            1. <dip:ObjectType>info:eu-repo/semantics/descriptiveMetadata</dip:ObjectType>

            </didl:Statement>

          </didl:Descriptor>

        2. <didl:Component>

          1. <didl:Resource mimeType="application/xml">

            1. <oai_dc:dc schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">

              1. <dc:title>1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance</dc:title>

              2. <dc:creator>Izpura Torres, José Ignacio</dc:creator>

              3. <dc:subject>Electrónica</dc:subject>

              4. <dc:description>Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge's formula but also allows the design of proper shields to reduce 1/f noise.</dc:description>

              5. <dc:publisher>E.T.S.I. Telecomunicación (UPM)</dc:publisher>

              6. <dc:rights>http://creativecommons.org/licenses/by-nc-nd/3.0/es/</dc:rights>

              7. <dc:date>2008-03</dc:date>

              8. <dc:type>info:eu-repo/semantics/article</dc:type>

              9. <dc:type>Artículo</dc:type>

              10. <dc:source>IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, 2008-03, Vol. 57, No. 3</dc:source>

              11. <dc:type>PeerReviewed</dc:type>

              12. <dc:format>application/pdf</dc:format>

              13. <dc:language>eng</dc:language>

              14. <dc:relation>http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf</dc:relation>

              15. <dc:relation>http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4447379&arnumber=4413160&count=26&index=6</dc:relation>

              16. <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>

              17. <dc:relation>info:eu-repo/semantics/altIdentifier/doi/10.1109/TIM.2007.911642</dc:relation>

              18. <dc:identifier>http://oa.upm.es/2038/</dc:identifier>

              </oai_dc:dc>

            </didl:Resource>

          </didl:Component>

        </didl:Item>

      5. <didl:Item>

        1. <didl:Descriptor>

          1. <didl:Statement mimeType="application/xml">

            1. <dip:ObjectType>info:eu-repo/semantics/objectFile</dip:ObjectType>

            </didl:Statement>

          </didl:Descriptor>

        2. <didl:Component>

          1. <didl:Resource mimeType="application/pdf" ref="http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf" />

          </didl:Component>

        </didl:Item>

      6. <didl:Item>

        1. <didl:Descriptor>

          1. <didl:Statement mimeType="application/xml">

            1. <dip:ObjectType>info:eu-repo/semantics/humanStartPage</dip:ObjectType>

            </didl:Statement>

          </didl:Descriptor>

        2. <didl:Component>

          1. <didl:Resource mimeType="application/html" ref="http://oa.upm.es/2038/" />

          </didl:Component>

        </didl:Item>

      </didl:Item>

    </didl:DIDL>

mets

Descargar XML

    <?xml version="1.0" encoding="UTF-8" ?>

  1. <mets:mets LABEL="Eprints Item" OBJID="eprint_2038" schemaLocation="http://www.loc.gov/METS/ http://www.loc.gov/standards/mets/mets.xsd http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-3.xsd">

    1. <mets:metsHdr CREATEDATE="2016-05-11T18:14:45Z">

      1. <mets:agent ROLE="CUSTODIAN" TYPE="ORGANIZATION">

        1. <mets:name>Archivo Digital UPM</mets:name>

        </mets:agent>

      </mets:metsHdr>

    2. <mets:dmdSec ID="DMD_eprint_2038_mods">

      1. <mets:mdWrap MDTYPE="MODS">

        1. <mets:xmlData>

          1. <mods:titleInfo>

            1. <mods:title>1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance</mods:title>

            </mods:titleInfo>

          2. <mods:name type="personal">

            1. <mods:namePart type="given">José Ignacio</mods:namePart>

            2. <mods:namePart type="family">Izpura Torres</mods:namePart>

            3. <mods:role>

              1. <mods:roleTerm type="text">author</mods:roleTerm>

              </mods:role>

            </mods:name>

          3. <mods:abstract>Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge's formula but also allows the design of proper shields to reduce 1/f noise.</mods:abstract>

          4. <mods:classification authority="lcc">Electrónica</mods:classification>

          5. <mods:originInfo>

            1. <mods:dateIssued encoding="iso8061">2008-03</mods:dateIssued>

            </mods:originInfo>

          6. <mods:originInfo>

            1. <mods:publisher>IEEE</mods:publisher>

            </mods:originInfo>

          7. <mods:genre>Artículo</mods:genre>

          </mets:xmlData>

        </mets:mdWrap>

      </mets:dmdSec>

    3. <mets:amdSec ID="TMD_eprint_2038">

      1. <mets:rightsMD ID="rights_eprint_2038_mods">

        1. <mets:mdWrap MDTYPE="MODS">

          1. <mets:xmlData>

            1. <mods:useAndReproduction>

              1. <p>

                1. <strong>De cara a formalizar correctamente todas las fases del proceso de autoarchivo, es MUY IMPORTANTE que lea y comprenda en su totalidad el contenido de las siguientes normas y los términos de esta licencia, antes de expresar su consentimiento y aceptación mediante un clic en el botón de ACEPTAR. A estos efectos el repositorio se denomina Archivo Digital UPM con la siguiente dirección de contacto archivo.digital@upm.es.</strong>

                </p>

              2. <p>El autor declara que es el titular de los derechos de propiedad intelectual, objeto de la presente cesión, en relación con la obra que autoarchiva, que ésta es una obra original, y que ostenta la condición de autor de esta obra.</p>

              3. <p>En caso de ser cotitular de tales derechos, el autor declara que cuenta con la autorización de los restantes titulares para hacer la presente cesión, y que los nombres de todos los coautores aparecen mencionados en la obra.</p>

              4. <p>En caso de previa cesión a terceros de derechos de explotación de la obra, el autor declara que tiene la oportuna reserva o autorización de dichos titulares de derechos a los fines de esta cesión.</p>

              5. <p>Con el fin de dar la máxima difusión a esta obra a través de internet, el autor cede a la Universidad Politécnica de Madrid, de forma gratuita y no exclusiva, por el máximo plazo legal y con ámbito universal, los derechos de reproducción, de distribución, de comunicación pública, incluido el derecho de puesta a disposición electrónica, para que pueda ser utilizada de forma libre y gratuita por todos los usuarios de internet, siempre que se cite su autoría y su uso se ajuste a las licencia Creative Commons elegida. Se entienden autorizados todos los actos necesarios para el registro de la obra, su seguridad y su conservación.</p>

              6. <p>El autor garantiza que el compromiso que aquí adquiere no infringe ningú n derecho de propiedad industrial, intelectual, derecho al honor, intimidad, o imagen, o cualquier otro derecho de terceros.</p>

              7. <p>El autor asume toda reclamación que pudiera ejercitarse contra la Universidad por terceros que vieran infringidos sus derechos a causa de la cesión.</p>

              8. <p>El autor renuncia a cualquier reclamación frente a la Universidad por las formas no ajustadas a la legislación vigente en que los usuarios hagan uso de las obras.</p>

              9. <p>El autor podrá solicitar la retirada de la obra del repositorio por causa justificada. A tal fin deberá ponerse en contacto con archivo.digital@upm.es. Asimismo, el repositorio podrá retirar la obra, previa notificación al autor, en supuestos suficientemente justificados, o en caso de reclamaciones de terceros. El autor será convenientemente notificado de cualquier reclamación que puedan formular terceras personas en relación con la obra.</p>

              10. <p>

                1. <strong>Para trabajos depositados por otros que no sean su autor:</strong>

                2. <strong>UPM</strong>

                </p>

              11. <p>Pulsar en el botón de depósitar E-print Ahora indica su aceptación de estos términos.</p>

              </mods:useAndReproduction>

            </mets:xmlData>

          </mets:mdWrap>

        </mets:rightsMD>

      </mets:amdSec>

    4. <mets:fileSec>

      1. <mets:fileGrp USE="reference">

        1. <mets:file ID="eprint_2038_1783_1" MIMETYPE="application/pdf" OWNERID="http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf" SIZE="330339">

          1. <mets:FLocat LOCTYPE="URL" href="http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf" type="simple" />

          </mets:file>

        </mets:fileGrp>

      </mets:fileSec>

    5. <mets:structMap>

      1. <mets:div ADMID="TMD_eprint_2038" DMDID="DMD_eprint_2038_mods">

        1. <mets:fptr FILEID="eprint_2038_document_1783_1" />

        </mets:div>

      </mets:structMap>

    </mets:mets>

oai_bibl

Descargar XML

    <?xml version="1.0" encoding="UTF-8" ?>

  1. <oai_dc:dc schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd" />

rdf

Descargar XML

    <?xml version="1.0" encoding="UTF-8" ?>

  1. <rdf:RDF>

    1. <rdf:Description about="">

      1. <foaf:primaryTopic resource="http://oa.upm.es/id/eprint/2038" />

      2. <rdfs:comment datatype="http://www.w3.org/2001/XMLSchema#string">The repository administrator has not yet configured an RDF license.</rdfs:comment>

      </rdf:Description>

    2. <rdf:Description about="http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf">

      1. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">INVE_MEM_2008_57462.pdf</rdfs:label>

      </rdf:Description>

    3. <rdf:Description about="http://oa.upm.es/2038/3/indexcodes.txt">

      1. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">indexcodes.txt</rdfs:label>

      </rdf:Description>

    4. <rdf:Description about="http://oa.upm.es/2038/4/lightbox.jpg">

      1. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">lightbox.jpg</rdfs:label>

      </rdf:Description>

    5. <rdf:Description about="http://oa.upm.es/2038/5/preview.jpg">

      1. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">preview.jpg</rdfs:label>

      </rdf:Description>

    6. <rdf:Description about="http://oa.upm.es/2038/6/medium.jpg">

      1. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">medium.jpg</rdfs:label>

      </rdf:Description>

    7. <rdf:Description about="http://oa.upm.es/2038/7/small.jpg">

      1. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">small.jpg</rdfs:label>

      </rdf:Description>

    8. <rdf:Description about="http://oa.upm.es/2038/">

      1. <dc:format>text/html</dc:format>

      2. <dc:title>HTML Summary of #2038 1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance</dc:title>

      3. <foaf:primaryTopic resource="http://oa.upm.es/id/eprint/2038" />

      </rdf:Description>

    9. <rdf:Description about="http://oa.upm.es/id/document/1783">

      1. <dct:hasPart resource="http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf" />
      2. <ep:hasFile resource="http://oa.upm.es/2038/1/INVE_MEM_2008_57462.pdf" />
      3. <rdf:type resource="http://purl.org/ontology/bibo/Document" />
      4. <rdf:type resource="http://eprints.org/ontology/Document" />

      5. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance (Pdf)</rdfs:label>

      </rdf:Description>

    10. <rdf:Description about="http://oa.upm.es/id/document/52016">

      1. <dct:hasPart resource="http://oa.upm.es/2038/3/indexcodes.txt" />
      2. <ep:hasFile resource="http://oa.upm.es/2038/3/indexcodes.txt" />
      3. <eprel:isIndexCodesVersionOf resource="http://oa.upm.es/id/document/1783" />
      4. <eprel:isVersionOf resource="http://oa.upm.es/id/document/1783" />
      5. <eprel:isVolatileVersionOf resource="http://oa.upm.es/id/document/1783" />
      6. <rdf:type resource="http://eprints.org/ontology/Document" />

      7. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance (Otro)</rdfs:label>

      </rdf:Description>

    11. <rdf:Description about="http://oa.upm.es/id/document/189582">

      1. <dct:hasPart resource="http://oa.upm.es/2038/4/lightbox.jpg" />
      2. <ep:hasFile resource="http://oa.upm.es/2038/4/lightbox.jpg" />
      3. <eprel:isVersionOf resource="http://oa.upm.es/id/document/1783" />
      4. <eprel:isVolatileVersionOf resource="http://oa.upm.es/id/document/1783" />
      5. <eprel:islightboxThumbnailVersionOf resource="http://oa.upm.es/id/document/1783" />
      6. <rdf:type resource="http://eprints.org/ontology/Document" />

      7. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance (Otro)</rdfs:label>

      </rdf:Description>

    12. <rdf:Description about="http://oa.upm.es/id/document/189585">

      1. <dct:hasPart resource="http://oa.upm.es/2038/5/preview.jpg" />
      2. <ep:hasFile resource="http://oa.upm.es/2038/5/preview.jpg" />
      3. <eprel:isVersionOf resource="http://oa.upm.es/id/document/1783" />
      4. <eprel:isVolatileVersionOf resource="http://oa.upm.es/id/document/1783" />
      5. <eprel:ispreviewThumbnailVersionOf resource="http://oa.upm.es/id/document/1783" />
      6. <rdf:type resource="http://eprints.org/ontology/Document" />

      7. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance (Otro)</rdfs:label>

      </rdf:Description>

    13. <rdf:Description about="http://oa.upm.es/id/document/189587">

      1. <dct:hasPart resource="http://oa.upm.es/2038/6/medium.jpg" />
      2. <ep:hasFile resource="http://oa.upm.es/2038/6/medium.jpg" />
      3. <eprel:isVersionOf resource="http://oa.upm.es/id/document/1783" />
      4. <eprel:isVolatileVersionOf resource="http://oa.upm.es/id/document/1783" />
      5. <eprel:ismediumThumbnailVersionOf resource="http://oa.upm.es/id/document/1783" />
      6. <rdf:type resource="http://eprints.org/ontology/Document" />

      7. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance (Otro)</rdfs:label>

      </rdf:Description>

    14. <rdf:Description about="http://oa.upm.es/id/document/189592">

      1. <dct:hasPart resource="http://oa.upm.es/2038/7/small.jpg" />
      2. <ep:hasFile resource="http://oa.upm.es/2038/7/small.jpg" />
      3. <eprel:isVersionOf resource="http://oa.upm.es/id/document/1783" />
      4. <eprel:isVolatileVersionOf resource="http://oa.upm.es/id/document/1783" />
      5. <eprel:issmallThumbnailVersionOf resource="http://oa.upm.es/id/document/1783" />
      6. <rdf:type resource="http://eprints.org/ontology/Document" />

      7. <rdfs:label datatype="http://www.w3.org/2001/XMLSchema#string">1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance (Otro)</rdfs:label>

      </rdf:Description>

    15. <rdf:Description about="http://oa.upm.es/id/eprint/2038#authors">

      1. <rdf:_1 resource="http://oa.upm.es/id/person/ext-f9ef8f3627151b330a634f75bd09a0dd" />

      </rdf:Description>

    16. <rdf:Description about="http://oa.upm.es/id/eprint/2038">

      1. <bibo:abstract datatype="http://www.w3.org/2001/XMLSchema#string">Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge's formula but also allows the design of proper shields to reduce 1/f noise.</bibo:abstract>

      2. <bibo:authorList resource="http://oa.upm.es/id/eprint/2038#authors" />

      3. <bibo:issue>3</bibo:issue>

      4. <bibo:status resource="http://purl.org/ontology/bibo/status/peerReviewed" />
      5. <bibo:status resource="http://purl.org/ontology/bibo/status/published" />

      6. <bibo:volume>57</bibo:volume>

      7. <dct:creator resource="http://oa.upm.es/id/person/ext-f9ef8f3627151b330a634f75bd09a0dd" />

      8. <dct:date>2008-03</dct:date>

      9. <dct:isPartOf resource="http://oa.upm.es/id/repository" />
      10. <dct:isPartOf resource="http://oa.upm.es/id/publication/ext-00189456" />
      11. <dct:publisher resource="http://oa.upm.es/id/org/ext-af0a9a5baed87c407844a3f5db44597c" />
      12. <dct:subject resource="http://oa.upm.es/id/subject/electronica" />

      13. <dct:title datatype="http://www.w3.org/2001/XMLSchema#string">1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance</dct:title>

      14. <ep:hasDocument resource="http://oa.upm.es/id/document/1783" />
      15. <ep:hasDocument resource="http://oa.upm.es/id/document/52016" />
      16. <ep:hasDocument resource="http://oa.upm.es/id/document/189582" />
      17. <ep:hasDocument resource="http://oa.upm.es/id/document/189585" />
      18. <ep:hasDocument resource="http://oa.upm.es/id/document/189587" />
      19. <ep:hasDocument resource="http://oa.upm.es/id/document/189592" />
      20. <rdf:type resource="http://purl.org/ontology/bibo/AcademicArticle" />
      21. <rdf:type resource="http://purl.org/ontology/bibo/Article" />
      22. <rdf:type resource="http://eprints.org/ontology/ArticleEPrint" />
      23. <rdf:type resource="http://eprints.org/ontology/EPrint" />
      24. <rdfs:seeAlso resource="http://oa.upm.es/2038/" />

      </rdf:Description>

    17. <rdf:Description about="http://oa.upm.es/id/subject/electronica">

      1. <rdf:type resource="http://www.w3.org/2004/02/skos/core#Concept" />

      2. <skos:prefLabel lang="en">Electronics</skos:prefLabel>

      3. <skos:prefLabel lang="es">Electrónica</skos:prefLabel>

      </rdf:Description>

    18. <rdf:Description about="http://oa.upm.es/id/org/ext-af0a9a5baed87c407844a3f5db44597c">

      1. <foaf:name datatype="http://www.w3.org/2001/XMLSchema#string">IEEE</foaf:name>

      2. <rdf:type resource="http://xmlns.com/foaf/0.1/Organization" />

      </rdf:Description>

    19. <rdf:Description about="http://oa.upm.es/id/person/ext-f9ef8f3627151b330a634f75bd09a0dd">

      1. <foaf:familyName datatype="http://www.w3.org/2001/XMLSchema#string">Izpura Torres</foaf:familyName>

      2. <foaf:givenName datatype="http://www.w3.org/2001/XMLSchema#string">José Ignacio</foaf:givenName>

      3. <foaf:name datatype="http://www.w3.org/2001/XMLSchema#string">José Ignacio Izpura Torres</foaf:name>

      4. <rdf:type resource="http://xmlns.com/foaf/0.1/Person" />

      </rdf:Description>

    20. <rdf:Description about="http://oa.upm.es/id/publication/ext-00189456">

      1. <bibo:issn>00189456</bibo:issn>

      2. <foaf:name datatype="http://www.w3.org/2001/XMLSchema#string">IEEE Transactions on Instrumentation and Measurement</foaf:name>

      3. <owl:sameAs resource="urn:issn:00189456" />
      4. <rdf:type resource="http://purl.org/ontology/bibo/Collection" />

      </rdf:Description>

    </rdf:RDF>

uketd_dc

Descargar XML

    <?xml version="1.0" encoding="UTF-8" ?>

  1. <uketd_dc:uketddc schemaLocation="http://naca.central.cranfield.ac.uk/ethos-oai/2.0/ http://naca.central.cranfield.ac.uk/ethos-oai/2.0/uketd_dc.xsd" />

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